Recording and Slides of our Webinar on the New Framework in QuantumATK for Smart and Efficient Simulations of Device IV Electrical Characteristics

Oct 22 2018

Check out the recording and slides of our webinar highlighting the new framework in QuantumATK for smart and efficient simulations of device IV electrical characteristics. We first introduce the new study object framework for handling complex computational workflows. Then we show how the IV Characteristics Study Object works as a combined framework for running multiple source-drain/gate voltage calculations, collecting, and analyzing the results. The IV Characteristics Study Object enables the calculation and analysis of the most relevant electrical characteristics of field-effect-transistor (FET) device models, including the on/off ratio, the subthreshold slope, the drain-induced barrier lowering and source-drain saturation voltage.

You can download the recording and slides here.
(our documentation website https://docs.quantumwise.com/webinars/webinars.html)

webinar iv recordings

 

During this webinar, discover efficient and smart simulations of device IV electrical characteristics with QuantumATK:

- Find out how IV Characteristics Study Object can assist you in running multiple source-drain/gate voltage calculations, collecting, and analyzing the results.  Learn from the example calculations on the model silicon-on-insulator (SOI) device and see how simulation results compare with experimental results.

-Learn how to build a device, set electrode repetitions, add gate regions, and how the new minimal electrode feature can automate the setup and repetition of the electrode.

-Learn more about the following features of the IV Characteristics Study Object:

o   Smart script restart.

o   Multilevel parallelism.

o   Seamless extension of the study with new data points.

o   Analysis module for IV characteristics.


Presented by:  Daniele Stradi, PhD,  senior application engineer at Synopsys QuantumATK Team.


You can learn more about the Study Object Concept in the QuantumATK documentation and about the IV Characteristics Study Object in the tutorial on simulating electrical characteristics for the model silicon-on-insulator (SOI) device.

 

You can download the recording and slides here.
(our documentation website https://docs.quantumwise.com/webinars/webinars.html)

 

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